• DocumentCode
    1436340
  • Title

    Low voltage built-in current sensor

  • Author

    Lee, Kuen-Jong ; Huang, Kou-Shung ; Huang, Min-Cheng

  • Author_Institution
    Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
  • Volume
    32
  • Issue
    21
  • fYear
    1996
  • fDate
    10/10/1996 12:00:00 AM
  • Firstpage
    1942
  • Lastpage
    1943
  • Abstract
    A low voltage built-in current sensor (BICS) for IDDQ testing based on the bulk-driven current mirror technique is proposed. This design has a small overhead in terms of area and needs only one external power supply. Different current resolution requirements can be met by adjusting the aspect ratio of the transistors in the design. HSPICE simulation results show that high error detection speed and small performance impact on the original circuit are also achieved
  • Keywords
    CMOS integrated circuits; SPICE; built-in self test; digital simulation; electric sensing devices; integrated circuit testing; CMOS; HSPICE simulation; IDDQ testing; IC testing; area overhead; aspect ratio; built-in current sensor; bulk-driven current mirror technique; current resolution requirements; error detection speed;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19961296
  • Filename
    542853
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1436340