DocumentCode :
1436493
Title :
Inferences on a simple step-stress model with type-II censored exponential data
Author :
Xiong, Chengjie
Author_Institution :
Dept. of Math., Southeast Missouri State Univ., Cape Girardeau, MO, USA
Volume :
47
Issue :
2
fYear :
1998
fDate :
6/1/1998 12:00:00 AM
Firstpage :
142
Lastpage :
146
Abstract :
This paper presents the inferences of parameters on the simple step-stress model in accelerated life testing with type-II censoring. An exponential life distribution with a mean that is a log-linear function of stress, and a cumulative exposure model are assumed. Maximum likelihood methods are used to estimate the parameters of these models. Hypothesis tests about model parameters are discussed. Confidence intervals for parameter-estimates are constructed using a pivotal quantity. The advantage of these results is that they apply to any sample size. A numerical example illustrates the inferential procedure
Keywords :
exponential distribution; failure analysis; inference mechanisms; life testing; maximum likelihood estimation; accelerated life testing; confidence intervals; cumulative exposure model; exponential life distribution; hypothesis tests; inferential procedure; log-linear function; maximum likelihood methods; parameter-estimates; pivotal quantity; simple step-stress model inferences; type-II censored exponential data; Dielectrics and electrical insulation; Electric breakdown; Electric shock; Life estimation; Life testing; Materials testing; Maximum likelihood estimation; Stress; Voltage; Weibull distribution;
fLanguage :
English
Journal_Title :
Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9529
Type :
jour
DOI :
10.1109/24.722278
Filename :
722278
Link To Document :
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