Inferences on a simple step-stress model with type-II censored exponential data

Author

Xiong, Chengjie

Author_Institution

Dept. of Math., Southeast Missouri State Univ., Cape Girardeau, MO, USA

Volume

47

Issue

2

fYear

1998

fDate

6/1/1998 12:00:00 AM

Firstpage

142

Lastpage

146

Abstract

This paper presents the inferences of parameters on the simple step-stress model in accelerated life testing with type-II censoring. An exponential life distribution with a mean that is a log-linear function of stress, and a cumulative exposure model are assumed. Maximum likelihood methods are used to estimate the parameters of these models. Hypothesis tests about model parameters are discussed. Confidence intervals for parameter-estimates are constructed using a pivotal quantity. The advantage of these results is that they apply to any sample size. A numerical example illustrates the inferential procedure

Keywords

exponential distribution; failure analysis; inference mechanisms; life testing; maximum likelihood estimation; accelerated life testing; confidence intervals; cumulative exposure model; exponential life distribution; hypothesis tests; inferential procedure; log-linear function; maximum likelihood methods; parameter-estimates; pivotal quantity; simple step-stress model inferences; type-II censored exponential data; Dielectrics and electrical insulation; Electric breakdown; Electric shock; Life estimation; Life testing; Materials testing; Maximum likelihood estimation; Stress; Voltage; Weibull distribution;

fLanguage

English

Journal_Title

Reliability, IEEE Transactions on

Publisher

ieee

ISSN

0018-9529

Type

jour

DOI

10.1109/24.722278

Filename

722278