DocumentCode :
1436505
Title :
A Novel Pixel Design for AM-OLED Displays Using Nanocrystalline Silicon TFTs
Author :
Lin, Chen-Wei ; Chao, Mango C -T ; Huang, Yen-Shih
Author_Institution :
Dept. of Electron. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
Volume :
19
Issue :
6
fYear :
2011
fDate :
6/1/2011 12:00:00 AM
Firstpage :
939
Lastpage :
952
Abstract :
This paper presents a novel pixel design for active matrix organic light emitting diode (AM-OLED) displays using nanocrystalline silicon thin-film transistors (TFTs). The proposed pixel design can effectively reduce the variation of its stored display data caused by the leakage current of nanocrystalline silicon TFTs, which can in turn increase the contrast resolution of AM-OLED displays. With a proper setting of its capacitors, the proposed pixel design can achieve a 5.55× reduction on its display-data variation while requiring only a 1.15× write time when compared to the typical pixel design. The aperture ratio resulting from the layout of the proposed pixel design can also be maintained above 40%, which satisfies the specification of most AM-OLED displays. A series of simulations as well as measurement results are provided to validate the effectiveness of the proposed pixel design.
Keywords :
elemental semiconductors; leakage currents; nanoelectronics; organic light emitting diodes; silicon; thin film transistors; AM-OLED display design; Si; active matrix organic light emitting diode displays; capacitors; contrast resolution; display-data variation; leakage current; nanocrystalline silicon TFT; pixel design; thin-film transistors; Active matrix organic light emitting diodes; Backplanes; Chaos; Costs; Flat panel displays; Liquid crystal displays; Manufacturing; Organic light emitting diodes; Silicon; Thin film transistors; Active Matrix Organic Light Emitting Diode (AM-OLED); coupling effect; microcrystalline thin-film transistor (TFT); nanocrystalline TFT;
fLanguage :
English
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
1063-8210
Type :
jour
DOI :
10.1109/TVLSI.2010.2042735
Filename :
5428768
Link To Document :
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