DocumentCode :
1436560
Title :
Ionizing Radiation Detector for Environmental Awareness in FPGA-Based Flight Computers
Author :
Buerkle, T. ; LaMeres, B.J. ; Kaiser, T. ; Gowens, E. ; Smoot, L. ; Heetderks, T. ; Schipf, K. ; Clem, L. ; Schielke, S. ; Luhr, R.
Author_Institution :
Dept. of Electr. & Comput. Eng., Montana State Univ., Bozeman, MT, USA
Volume :
12
Issue :
6
fYear :
2012
fDate :
6/1/2012 12:00:00 AM
Firstpage :
2229
Lastpage :
2236
Abstract :
Ionizing radiation has a detrimental effect on digital electronics which need to operate in extraterrestrial environments. Modern reconfigurable digital fabrics are enabling new architectures for flight computers, which can exploit environmental awareness to increase their fault tolerance. In this paper, we present the design, modeling, and characterization of a radiation sensor which can be coupled with a reprogrammable hardware fabric to provide spatial information about radiation events that can cause logical faults. The sensor uses a wide area PN junction as its fundamental sensing element. As radiation passes through the sensor, electron hole pairs are created. The internal electric field of the PN junction sweeps the charge carriers in opposite directions which are ultimately sensed by orthogonally placed electrodes on the top and bottom of the sensor. This XY grid provides the spatial location of an ionizing radiation strike, which can be fed to the coupled computer fabric for environmental awareness. A reverse bias voltage is applied to the sensor in order to fully deplete the substrate for maximum charge carrier generation. The sensor is designed to detect the spatial location of radiation strikes of energy levels, which can cause faults in commercial field programmable gate arrays substrates.
Keywords :
computers; fault tolerance; field programmable gate arrays; radiation detection; sensors; FPGA-based flight computers; XY grid; commercial field programmable gate arrays substrates; digital electronics; environmental awareness; extraterrestrial environments; fault tolerance; ionizing radiation detector; ionizing radiation strike; logical faults; maximum charge carrier generation; reprogrammable hardware fabric; reverse bias voltage; spatial location; wide area PN junction; Charge carrier processes; Circuit faults; Conductivity; Extraterrestrial measurements; Ionization; Radiation; Radiation sensors; radiation tolerant computing; silicon radiation detectors;
fLanguage :
English
Journal_Title :
Sensors Journal, IEEE
Publisher :
ieee
ISSN :
1530-437X
Type :
jour
DOI :
10.1109/JSEN.2012.2186288
Filename :
6143977
Link To Document :
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