• DocumentCode
    1436583
  • Title

    A Markovian Approach for DEM Estimation From Multiple InSAR Data With Atmospheric Contributions

  • Author

    Shabou, Aymen ; Tupin, Florence

  • Author_Institution
    Lab. Traitement et Commun. de l´´Inf., Inst. TELECOM, Paris, France
  • Volume
    9
  • Issue
    4
  • fYear
    2012
  • fDate
    7/1/2012 12:00:00 AM
  • Firstpage
    764
  • Lastpage
    768
  • Abstract
    Accurate digital elevation model (DEM) estimation using synthetic aperture radar interferometry still remains a challenging problem in the geographical information science community, particularly in dealing with a high noise rate and atmospheric disturbances. Such task suffers from the lack of efficient and reliable methods to overcome these artifacts. This work provides a method that aims to solve this problem through a Bayesian formulation with the Markovian energy minimization framework. The DEM is generated from a set of multifrequency/multibaseline interferograms using a multichannel phase unwrapping algorithm combined with an estimation method of the atmospheric artifacts. A set of experimental results illustrates the effectiveness and robustness of the proposed approach.
  • Keywords
    atmospheric techniques; digital elevation models; remote sensing by radar; synthetic aperture radar; Bayesian formulation; DEM estimation; Markovian approach; Markovian energy minimization framework; atmospheric artifacts; atmospheric contributions; atmospheric disturbances; digital elevation model; geographical information science community; high noise rate; multichannel phase unwrapping algorithm; multifrequency-multibaseline interferograms; multiple InSAR data; synthetic aperture radar interferometry; Atmospheric modeling; Bayesian methods; Estimation; Image reconstruction; Joints; Optimization; Surface topography; Atmospheric contributions; graph cuts; multichannel phase unwrapping (PU) (MCPU); synthetic aperture radar (SAR) interferometry (InSAR);
  • fLanguage
    English
  • Journal_Title
    Geoscience and Remote Sensing Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1545-598X
  • Type

    jour

  • DOI
    10.1109/LGRS.2011.2181326
  • Filename
    6143980