• DocumentCode
    1437004
  • Title

    Computer techniques for solving metal-semiconductor barrier height. Application to Au - CdS thin-film Schottky diodes

  • Author

    Nguyen, P.H. ; Lepley, B. ; Nadeau, A. ; Ravelet, S.

  • Author_Institution
    Institute des Sciences de L´´Ingenieur, Laboratoire d´´Electronique et de Physique du Sollde, Vandoeuvre-lÿs-Nancy, France
  • Volume
    122
  • Issue
    11
  • fYear
    1975
  • fDate
    11/1/1975 12:00:00 AM
  • Firstpage
    1193
  • Lastpage
    1196
  • Abstract
    Computer programs are developed for numerical determination of the Schottky-barrier heights from the differential capacitance method, the current/voltage characteristic method under forward bias and the Fowler photocurrent method. The basic theory of these methods is briefly described. As a practical application, the programs have been used to investigate metal-semiconductor contact properties.
  • Keywords
    Schottky-barrier diodes; electronics applications of computers; numerical methods; semiconductor-metal boundaries; thin film devices; Fowler photocurrent method; Schottky diodes; computer techniques; contact properties; differential-capacitance method; metal semiconductor barrier height;
  • fLanguage
    English
  • Journal_Title
    Electrical Engineers, Proceedings of the Institution of
  • Publisher
    iet
  • ISSN
    0020-3270
  • Type

    jour

  • DOI
    10.1049/piee.1975.0294
  • Filename
    5252526
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1437004