• DocumentCode
    1437131
  • Title

    System-level performance evaluation of three-dimensional integrated circuits

  • Author

    Rahman, Arifur ; Reif, Rafael

  • Author_Institution
    Microsystems Technol. Lab., MIT, Cambridge, MA, USA
  • Volume
    8
  • Issue
    6
  • fYear
    2000
  • Firstpage
    671
  • Lastpage
    678
  • Abstract
    In this paper, the wire (interconnect)-length distribution of three-dimensional (3-D) integrated circuits (ICs) is derived using Rent´s rule and following the methodology used to estimate two-dimensional (2-D) (wire-length distribution). Two limiting cases of connectivity between logic gates on different device layers are examined by comparing the wire-length distribution and average and total wire-length. System performance metrics such as clock frequency, chip area, etc., are estimated using wire-length distribution, interconnect delay criteria, and simple models representing the cost or complexity for manufacturing 3-D ICs. The technology requirement for interconnects in 3-D integration is also discussed.
  • Keywords
    VLSI; circuit layout CAD; delays; integrated circuit interconnections; integrated circuit layout; integrated circuit modelling; wiring; VLSI; chip area; clock frequency; connectivity; device layers; interconnect delay criteria; interconnect-length distribution; system-level performance evaluation; three-dimensional integrated circuits; total wire-length; wire-length distribution; Clocks; Costs; Delay estimation; Frequency estimation; Integrated circuit interconnections; Logic devices; Logic gates; System performance; Two dimensional displays; Wire;
  • fLanguage
    English
  • Journal_Title
    Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1063-8210
  • Type

    jour

  • DOI
    10.1109/92.902261
  • Filename
    902261