DocumentCode :
1437282
Title :
Spike voltages seen during "quick charge" ramp limitation tests on Nb/sub 3/Sn cable-in-conduit conductors
Author :
Takayasu, M. ; Vysotsky, V.S. ; Jeong, S. ; Michael, P.C. ; Schultz, J.H. ; Minervini, J.V.
Author_Institution :
Plasma Fusion Center, MIT, Cambridge, MA, USA
Volume :
7
Issue :
2
fYear :
1997
fDate :
6/1/1997 12:00:00 AM
Firstpage :
150
Lastpage :
154
Abstract :
Spike voltages observed during ramp rate limitation tests on sub-sized Nb/sub 3/Sn cable-in-conduit superconductors are analyzed using current loop model. The effects of loop currents on the ramp limitations of multi strand superconducting cables are discussed. Current loops existing in multi strand cables generate excess local currents that quench strands and produce voltage spikes. Experimental results previously reported as abnormal ramp rate limitations are explained by loop current phenomena.
Keywords :
multifilamentary superconductors; niobium alloys; superconducting cables; tin alloys; Nb/sub 3/Sn; cable-in-conduit conductor; current loop model; multistrand superconducting cable; quenching; quick charge ramp rate limitation test; spike voltage; Conductors; Contact resistance; Current distribution; Niobium; Power cables; Superconducting cables; Superconductivity; Testing; Tin; Voltage;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/77.614444
Filename :
614444
Link To Document :
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