• DocumentCode
    1437293
  • Title

    Stability and Noise Analysis of Coupled-Oscillator Systems

  • Author

    Suárez, Almudena ; Ramírez, Franco ; Sancho, Sergio

  • Author_Institution
    Dept. de Ing. de Comun., Univ. de Cantabria, Santander, Spain
  • Volume
    59
  • Issue
    4
  • fYear
    2011
  • fDate
    4/1/2011 12:00:00 AM
  • Firstpage
    1032
  • Lastpage
    1046
  • Abstract
    We present a simplified closed-form formulation for the optimized design of coupled-oscillator systems. It is based on admittance models for the oscillator elements, extracted from HB simulations. The formulation relates explicitly the coupled-system oscillation frequency and amplitude and phase distributions with the parameters of the coupling network and the oscillator elements. It allows anticipating and understanding the form of variation of the system variables and can be used for an insightful design. With a perturbation analysis based on the new formulation, we will generalize existing stability criteria to more complete oscillator models. A combined amplitude- and phase-noise formulation will enable the prediction of the phase-noise spectrum flattening near oscillator carrier, while taking into account the system resonances that affect the spectrum shape. The techniques have been successfully applied to a coupled-oscillator system at 5.2 GHz.
  • Keywords
    coupled circuits; integrated circuit noise; network analysis; oscillators; phase noise; admittance models; closed-form formulation; coupled-oscillator systems; frequency 5.2 GHz; noise analysis; oscillator carrier; oscillator elements; perturbation analysis; phase-noise spectrum flattening; Admittance; Couplings; Noise; Numerical stability; Oscillators; Stability analysis; Tuning; Coupled oscillators; coupled-oscillator system; near carrier noise; phase-noise analysis; phased arrays; reduced-order model; stability analysis;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/TMTT.2010.2103091
  • Filename
    5703155