Microstructural effects in capacitive composition measurements

Author

Pearson, Ronald K.

Author_Institution

E.I. du Pont de Nemours & Co. Inc., Wilmington, DE, USA

Volume

39

Issue

2

fYear

1990

fDate

4/1/1990 12:00:00 AM

Firstpage

421

Lastpage

424

Abstract

Capacitance-based sensors offer practical advantages for binary composition measurements in various manufacturing processes. The implications of the microstructure of binary mixtures in capacitive composition measurements are explored. Specifically, it is shown that microstructural assumptions can be used to derive measurement uncertainty bounds when inferring composition from measured capacitances. Worst-case bounds are obtained from the well-known series/parallel bounds on the total capacitance of a binary mixture, while tighter bounds are obtained from results of Hashin and Shtrikman for isotropic mixtures

Keywords

chemical variables measurement; electric sensing devices; Hashin-Shtrikman bounds; binary composition measurements; binary mixtures; capacitance sensor; capacitive composition measurements; chemical sensor; isotropic mixtures; manufacturing processes; measurement uncertainty bounds; microstructural effects; series/parallel bounds; worst case bounds; Boundary conditions; Capacitance measurement; Capacitive sensors; Dielectric measurements; Electrodes; Electromagnetic measurements; Equations; Measurement uncertainty; Microstructure; Volume measurement;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/19.52526

Filename

52526