• DocumentCode
    1437444
  • Title

    Multiple penetration of a TEz-polarized plane wave into multilayered cylindrical cavity-backed apertures

  • Author

    Yin, Wen-Yan ; Li, Le-Wei ; Yeo, Tat-Soon ; Leong, Mook-Seng

  • Author_Institution
    Communications/Microwave Div., Nat. Univ. of Singapore, Singapore
  • Volume
    42
  • Issue
    4
  • fYear
    2000
  • fDate
    11/1/2000 12:00:00 AM
  • Firstpage
    330
  • Lastpage
    338
  • Abstract
    A generalized mathematical procedure is developed for investigating a TEz-polarized plane wave penetration through two-dimensional (2-D) multilayered cylindrical cavity-backed apertures. The mathematical treatment is based on the direct integral equation technique combined with the Galerkin´s procedure. Both the near- and far-zone field solutions to such a multiple coupling system are obtained in an analytical form. By taking the aperture edge effects into account, the magnetic currents on the surrounded multiple apertures are expanded in terms of a series of Chebyshev polynomials of the first kind. Furthermore, parametric studies are performed to show the variation of the penetrated near-zone magnetic field in various cylindrical cavity-backed apertures with the aperture number and geometrical sizes
  • Keywords
    Chebyshev approximation; Galerkin method; electromagnetic compatibility; electromagnetic interference; electromagnetic shielding; electromagnetic wave polarisation; integral equations; polynomials; 2D multilayered cylindrical cavity-backed apertures; Chebyshev polynomials; EMC; EMI; Galerkin´s procedure; TEz-polarized plane wave penetration; aperture edge effects; direct integral equation technique; far-zone field solutions; magnetic currents; multiple coupling system; near-zone field solutions; parametric studies; penetrated near-zone magnetic field; shielding; Apertures; Electromagnetic compatibility; Electromagnetic interference; Electromagnetic radiation; Electromagnetic scattering; Electromagnetic shielding; Integral equations; Polynomials; Tellurium; Two dimensional displays;
  • fLanguage
    English
  • Journal_Title
    Electromagnetic Compatibility, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9375
  • Type

    jour

  • DOI
    10.1109/15.902302
  • Filename
    902302