Title :
Space Radiation Effects and Reliability Considerations for Micro- and Optoelectronic Devices
Author :
Johnston, Allan H.
Author_Institution :
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
Abstract :
The interplay between radiation effects and reliability is discussed for micro- and optoelectronic devices. Topics discussed include basic approaches such as burn-in and electrical screening that are used to improve component reliability, synergistic effects between reliability and radiation effects, the impact of microdose damage from heavy ions on reliability of high-density digital circuits, and assessing the overall risk to components in space that are subjected to overstress conditions.
Keywords :
digital circuits; integrated circuit reliability; optoelectronic devices; radiation effects; electrical screening; high-density digital circuits; microdose damage; microelectronic devices; optoelectronic devices; reliability; space radiation effects; Microelectronics; optoelectronics; radiation damage; reliability; space radiation;
Journal_Title :
Device and Materials Reliability, IEEE Transactions on
DOI :
10.1109/TDMR.2010.2048111
