Frequency Domain Multiplexed Readout of TES Detector Arrays With Baseband Feedback

Author

Hartog, Roland Den ; Beyer, Jörn ; Boersma, Dick ; Bruijn, Marcel ; Gottardi, Luciano ; Hoevers, Henk ; Hou, Rui ; Kiviranta, Mikko ; De Korte, Piet ; Van der Kuur, Jan ; Van Leeuwen, Bert-Joost ; Lindeman, Mark ; Nieuwenhuizen, Ad

Author_Institution

SRON Nat. Inst. for Space Res., Utrecht, Netherlands

Volume

21

Issue

3

fYear

2011

fDate

6/1/2011 12:00:00 AM

Firstpage

289

Lastpage

293

Abstract

SRON is developing an electronic read-out system for an array of Transition-Edge Sensors (TES) which combines the techniques of Frequency Domain Multiplexing (FDM) with Base-Band FeedBack (BBFB). Its potential astronomical applications are in the read-out of soft X-ray microcalorimeters of the XMS instrument on the International X-ray Observatory (IXO) and the far-IR bolometers of the SAFARI instrument on the Japanese-European mission SPICA. In this paper we focus on the experimental verification of the system, demonstrating for 16 pixels that simultaneous read-out does not degrade the noise performance, and that crosstalk between pixels is close to the requirements for IXO. A detailed analysis of the BBFB system is presented, identifying its limitations and routes for improvement to the levels required for implementation on both missions.

Keywords

SQUIDs; X-ray astronomy; bolometers; frequency division multiplexing; infrared astronomy; particle calorimetry; readout electronics; superconducting photodetectors; transition radiation detectors; BBFB; FDM; IXO; SAFARI instrument; SRON; TES detector array; XMS instrument; astronomical application; baseband feedback; electronic read-out system; frequency domain multiplexed readout; international X-ray observatory; soft X-ray microcalorimeters; transition-edge sensor; Detectors; Frequency division multiplexing; Instruments; Noise; Pixel; SQUIDs; Bolometers; FDM; IXO; SPICA; SQUID read-out electronics; TES; microcalorimeters;

fLanguage

English

Journal_Title

Applied Superconductivity, IEEE Transactions on

Publisher

ieee

ISSN

1051-8223

Type

jour

DOI

10.1109/TASC.2010.2101998

Filename

5704168