DocumentCode :
1437952
Title :
Shot Noise Thermometry for Thermal Characterization of Templated Carbon Nanotubes
Author :
Sayer, Robert A. ; Kim, Sunkook ; Franklin, Aaron D. ; Mohammadi, Saeed ; Fisher, Timothy S.
Author_Institution :
Sch. of Mech. Eng., Purdue Univ., West Lafayette, IN, USA
Volume :
33
Issue :
1
fYear :
2010
fDate :
3/1/2010 12:00:00 AM
Firstpage :
178
Lastpage :
183
Abstract :
A carbon nanotube (CNT) thermometer that operates on the principles of electrical shot noise is reported. Shot noise thermometry is a self-calibrating measurement technique that relates statistical fluctuations in dc current across a device to temperature. A structure consisting of vertical, top, and bottom-contacted single-walled carbon nanotubes in a porous anodic alumina template was fabricated and used to measure shot noise. Frequencies between 60 and 100 kHz were observed to preclude significant influence from Vf noise, which does not contain thermally relevant information. Because isothermal models do not accurately reproduce the observed noise trends, a self-heating shot noise model has been developed and applied to experimental data to determine the thermal resistance of a CNT device consisting of an array of vertical single-walled CNTs supported in a porous anodic alumina template. The thermal surface resistance at the nanotube-dielectric interface is found to be 1.5 × 108 K/W, which is consistent with measurements by other techniques.
Keywords :
carbon nanotubes; nanotube devices; resistance thermometers; shot noise; thermal resistance; C; CNT device; frequency 60 kHz to 100 kHz; nanotube-dielectric interface; self-calibrating measurement technique; self-heating shot noise model; shot noise thermometry; single-walled carbon nanotubes; thermal surface resistance; thermometer; Carbon nanotubes; Electrical resistance measurement; Fluctuations; Frequency; Isothermal processes; Measurement techniques; Noise measurement; Surface resistance; Temperature distribution; Thermal resistance; Carbon nanotubes; electrical noise; thermal resistance;
fLanguage :
English
Journal_Title :
Components and Packaging Technologies, IEEE Transactions on
Publisher :
ieee
ISSN :
1521-3331
Type :
jour
DOI :
10.1109/TCAPT.2009.2038488
Filename :
5429150
Link To Document :
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