Title :
Soft X-ray spectroscopic study of a gas-puff Z-pinch argon plasma
Author :
Kim, Seong Ho ; Kim, Dong-Eon ; Lee, Tong Nyong
Author_Institution :
Dept. of Phys., Pohang Univ. of Sci. & Technol., South Korea
fDate :
8/1/1998 12:00:00 AM
Abstract :
X-ray radiation characteristics of argon plasma produced by a gas-puff Z-pinch device were investigated using an X-ray crystal spectrometer, an X-ray diode, and an extreme ultraviolet (XUV) spectrometer. Using a germanium crystal we have observed spectral emission from Ar XVII produced by hot spots at the pinched stage. With the help of a 2-m grazing incidence XUV spectrometer, the spectrum of 30 to 250 Å were obtained. Strong lines from Ar VIII to Ar XIII were observed with a continuum whose peak is around 120 Å. The radiation energy in the spectral range is estimated to be about 23 joule which is about 0.6% of the electrical energy stored in capacitors
Keywords :
X-ray emission spectra; Z pinch; argon; plasma diagnostics; 30 to 250 A; Ar; Ar VIII; Ar XIII; Ar XVII; X-ray crystal spectrometer; X-ray diode; X-ray radiation characteristics; capacitors; electrical energy storage; extreme UV spectrometer; gas-puff Z-pinch Ar plasma; gas-puff Z-pinch device; germanium crystal; grazing incidence XUV spectrometer; hot spots; radiation energy; soft X-ray spectroscopy; spectral emission; spectral range; Argon; Capacitors; Diodes; Plasma devices; Plasma properties; Plasma x-ray sources; Spectroscopy; Switches; X-ray lasers; X-ray scattering;
Journal_Title :
Plasma Science, IEEE Transactions on