• DocumentCode
    1438091
  • Title

    Assessment of random and systematic errors in microwave and submillimetre dielectric measurements

  • Author

    Afsar, M.N. ; Chamberlain, J. ; Chantry, G.W. ; Finsy, R. ; van Loon, R.

  • Author_Institution
    National Physical Laboratory, Teddington, UK
  • Volume
    124
  • Issue
    6
  • fYear
    1977
  • fDate
    6/1/1977 12:00:00 AM
  • Firstpage
    575
  • Lastpage
    577
  • Abstract
    By considering the variation between runs comprising a given experiment, between the average results of independent experiments and between the extrapolated results of different experimental methods, some assessment of the systematic and random errors to be expected in high-frequency dielectric measurements is obtained. The liquid investigated is chlorobenzene as this has good chemical properties, possesses a rigid molecule and has been extensively investigated over a wide frequency range by other workers. Our results show that the random errors are frequency dependent but have average values of ±1.5% for ¿ and ±0.1% for n but that the systematic errors may reach as much as ± 3% for ¿ and ± 0.6% for n in the difficult regions. By combining data over a wide frequency range one may arrive at continuous curves whose estimated errors are ±1% for ¿ and ±0.2% for n.
  • Keywords
    dielectric measurement; measurement errors; microwave measurement; chlorobenzene; error assessment; microwave dielectric measurement; random error; systematic errors;
  • fLanguage
    English
  • Journal_Title
    Electrical Engineers, Proceedings of the Institution of
  • Publisher
    iet
  • ISSN
    0020-3270
  • Type

    jour

  • DOI
    10.1049/piee.1977.0121
  • Filename
    5252704