DocumentCode
1438091
Title
Assessment of random and systematic errors in microwave and submillimetre dielectric measurements
Author
Afsar, M.N. ; Chamberlain, J. ; Chantry, G.W. ; Finsy, R. ; van Loon, R.
Author_Institution
National Physical Laboratory, Teddington, UK
Volume
124
Issue
6
fYear
1977
fDate
6/1/1977 12:00:00 AM
Firstpage
575
Lastpage
577
Abstract
By considering the variation between runs comprising a given experiment, between the average results of independent experiments and between the extrapolated results of different experimental methods, some assessment of the systematic and random errors to be expected in high-frequency dielectric measurements is obtained. The liquid investigated is chlorobenzene as this has good chemical properties, possesses a rigid molecule and has been extensively investigated over a wide frequency range by other workers. Our results show that the random errors are frequency dependent but have average values of ±1.5% for ¿ and ±0.1% for n but that the systematic errors may reach as much as ± 3% for ¿ and ± 0.6% for n in the difficult regions. By combining data over a wide frequency range one may arrive at continuous curves whose estimated errors are ±1% for ¿ and ±0.2% for n.
Keywords
dielectric measurement; measurement errors; microwave measurement; chlorobenzene; error assessment; microwave dielectric measurement; random error; systematic errors;
fLanguage
English
Journal_Title
Electrical Engineers, Proceedings of the Institution of
Publisher
iet
ISSN
0020-3270
Type
jour
DOI
10.1049/piee.1977.0121
Filename
5252704
Link To Document