DocumentCode
1438127
Title
Determination of diffusion length from within a confined region with the use of EBIC
Author
Ong, Vincent K.S. ; Wu, Dethau
Author_Institution
Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore
Volume
48
Issue
2
fYear
2001
fDate
2/1/2001 12:00:00 AM
Firstpage
332
Lastpage
337
Abstract
A new method of extracting minority carrier diffusion length from within a confined region of material is presented in this paper. This technique uses the finite difference method and can be used on samples where the diffusion lengths are longer than the width of the region. This cannot be achieved using the conventional method, which evaluates the negative reciprocal of the slope of the EBIC signals line scan plotted on a semi-logarithmic scale. A limitation of this method is that the beam entrance surface of the sample is assumed to have negligible surface recombination
Keywords
EBIC; carrier lifetime; finite difference methods; minority carriers; EBIC measurement; confined region; finite difference method; minority carrier diffusion length; parameter extraction; Carrier confinement; Current density; Electron beams; Electron microscopy; Finite difference methods; Length measurement; Radiative recombination; Scanning electron microscopy; Semiconductor materials; Spontaneous emission;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/16.902735
Filename
902735
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