• DocumentCode
    1438127
  • Title

    Determination of diffusion length from within a confined region with the use of EBIC

  • Author

    Ong, Vincent K.S. ; Wu, Dethau

  • Author_Institution
    Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore
  • Volume
    48
  • Issue
    2
  • fYear
    2001
  • fDate
    2/1/2001 12:00:00 AM
  • Firstpage
    332
  • Lastpage
    337
  • Abstract
    A new method of extracting minority carrier diffusion length from within a confined region of material is presented in this paper. This technique uses the finite difference method and can be used on samples where the diffusion lengths are longer than the width of the region. This cannot be achieved using the conventional method, which evaluates the negative reciprocal of the slope of the EBIC signals line scan plotted on a semi-logarithmic scale. A limitation of this method is that the beam entrance surface of the sample is assumed to have negligible surface recombination
  • Keywords
    EBIC; carrier lifetime; finite difference methods; minority carriers; EBIC measurement; confined region; finite difference method; minority carrier diffusion length; parameter extraction; Carrier confinement; Current density; Electron beams; Electron microscopy; Finite difference methods; Length measurement; Radiative recombination; Scanning electron microscopy; Semiconductor materials; Spontaneous emission;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.902735
  • Filename
    902735