DocumentCode :
1438322
Title :
An asynchronous instruction length decoder
Author :
Stevens, Kenneth S. ; Rotem, Shai ; Ginosar, Ran ; Beerel, Peter ; Myers, Chris J. ; Yun, Kenneth Y. ; Koi, R. ; Dike, Charles ; Roncken, Marly
Author_Institution :
Intel Corp., Hillsboro, OR, USA
Volume :
36
Issue :
2
fYear :
2001
fDate :
2/1/2001 12:00:00 AM
Firstpage :
217
Lastpage :
228
Abstract :
This paper describes an investigation of potential advantages and pitfalls of applying an asynchronous design methodology to an advanced microprocessor architecture. A prototype complex instruction set length decoding and steering unit was implemented using self-timed circuits. [The Revolving Asynchronous Pentium(R) Processor Instruction Decoder (RAPPID) design implemented the complete Pentium II(R) 32-bit MMX instruction set.] The prototype chip was fabricated on a 0.25 μm CMOS process and tested successfully. Results show significant advantages - in particular, performance of 2.5-4.5 instructions per nanosecond - with manageable risks using this design technology. The prototype achieves three times the throughput and half the latency, dissipating only half the power and requiring about the same area as the fastest commercial 400 MHz clocked circuit fabricated on the same process
Keywords :
CMOS logic circuits; asynchronous circuits; decoding; design for testability; high-speed integrated circuits; instruction sets; integrated circuit design; logic design; microprocessor chips; timing; 0.25 micron; 32 bit; 700 MHz to 3.6 GHz; CMOS process; DFT; Pentium II MMX instruction set; advanced microprocessor architecture; asynchronous design methodology; asynchronous instruction length decoder; complex instruction set length decoding; instruction set length decoding/steering unit; microarchitecture; revolving asynchronous Pentium processor instruction decoder; self-timed circuits; Automatic testing; CMOS process; CMOS technology; Circuit testing; Decoding; Design methodology; Microprocessors; Prototypes; Risk management; Technology management;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/4.902762
Filename :
902762
Link To Document :
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