Title :
SVDD-based one-class land-cover mapping using optimal training samples
Author :
Muyi Li ; Xiufang Zhu ; Jianyu Gu ; Guanyuan Shuai ; Anzhou Zhao ; Tong Zhou ; Yaozhong Pan
Author_Institution :
Coll. of Resources Sci. & Technol./State Key Lab. of Earth Surface Processes & Resource Ecology, Beijing Normal Univ., Beijing, China
Abstract :
Remotely sensed data have been widely used in the field of producing land-cover thematic maps. When dealing with single class problem, one-class classifiers proved to be more effective compared with conventional supervised classifiers. The Support Vector Data Description (SVDD), one kind of one-class classification method, has been applied to specific land-cover classifications lately. However, the sampling scheme used in previous studies does not follow the SVDD principle. In this paper, Euclidean distance and Mahalanobis distance were chosen as an index to optimize training samples in order to improve the accuracy of SVDD classification. Result shows that sample optimization do improve the classification accuracy. Besides, compared with the Euclidean distance, Mahalanobis distance is more suitable and effective for sample optimization.
Keywords :
data description; geophysics computing; land cover; learning (artificial intelligence); optimisation; pattern classification; sampling methods; support vector machines; terrain mapping; Euclidean distance; Mahalanobis distance; SVDD-based one-class land-cover mapping; land-cover classifications; land-cover thematic maps; one-class classification method; one-class classifiers; optimal training samples; remotely sensed data; sample optimization; sampling scheme; supervised classifiers; support vector data description classification accuracy; support vector data description principle; Accuracy; Euclidean distance; Indexes; Optimization; Remote sensing; Support vector machines; Training; One-class classification; Optimal training samples; Summer maize; Support Vector Data Description;
Conference_Titel :
Geoscience and Remote Sensing Symposium (IGARSS), 2014 IEEE International
Conference_Location :
Quebec City, QC
DOI :
10.1109/IGARSS.2014.6947254