• DocumentCode
    1438627
  • Title

    Computer simulations of low noise states in a high-power crossed-field amplifier

  • Author

    Chernin, David P.

  • Author_Institution
    Sci. Applications Int. Corp., McLean, VA, USA
  • Volume
    43
  • Issue
    11
  • fYear
    1996
  • fDate
    11/1/1996 12:00:00 AM
  • Firstpage
    2004
  • Lastpage
    2010
  • Abstract
    A large body of experimental data has been accumulated over the past 15 years or so on the remarkable ability of both magnetrons and CFA´s to operate under certain conditions at noise levels comparable to those achieved in linear beam tubes. SAIC´s MASK code, a 2½-D particle-in-cell code, has been able to compute total, integrated noise power to an accuracy of ± a few dB in a high-power CFA, operating with a typical intra-pulse spectral noise density of ~47-50 dB/MHz. Under conditions that produced low noise (~60-100 dB/MHz) in laboratory experiments, the MASK code has been, until now, unable to reproduce similar results. The present paper reports the first successful production of a very low noise state in a CFA simulation using the MASK code. The onset of this low noise state is quite sudden, appearing abruptly as the current is raised to a point near which the cathode operates as nearly emission limited. This behavior is similar to that seen in an experimentally observed transition between low noise and high noise operation in the SFD-266, a Varian [CPI] low noise CFA. Some comments are made concerning the nature of the noise as observed in the simulation and in the laboratory
  • Keywords
    digital simulation; electron device noise; electronic engineering computing; microwave power amplifiers; microwave tubes; random noise; 2½-D particle-in-cell code; MASK code; RF output power; S/N ratio; SFD-266; Varian CPI low noise CFA; computer simulation; emission limited operation; high-power crossed-field amplifier; intra-pulse spectral noise density; low noise conditions; low noise states; total integrated noise power; Computational modeling; Computer simulation; High power amplifiers; Laboratories; Low-noise amplifiers; Magnetrons; Noise level; Particle measurements; Predictive models; Time measurement;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.543039
  • Filename
    543039