DocumentCode
1438731
Title
Defect-oriented diagnosis for very deep-submicron systems
Author
Lombardi, Fabrizio ; Metra, Cecilia
Author_Institution
Northeastern University
Volume
18
Issue
1
fYear
2001
Firstpage
8
Lastpage
9
Keywords
Atomic force microscopy; Circuit faults; Circuit testing; Current measurement; Design for testability; Electrical resistance measurement; Fault diagnosis; Logic; Signal analysis; System testing;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/MDT.2001.902817
Filename
902817
Link To Document