Title :
Fault detection and location using IDD waveform analysis
Author :
Muhammad, Khurram ; Roy, Kaushik
Author_Institution :
Dept. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
Abstract :
This paper shows that IDD waveform analysis can detect defects that IDDQ testing cannot. An investigation of IDD waveform analysis methods-one based on integrators, one on fast Fourier transform-confirms that such analysis enables fault localization testing in static and dynamic CMOS circuits
Keywords :
fault location; integrated circuit testing; logic testing; waveform analysis; CMOS circuits; IDD waveform analysis; fast Fourier transform; fault detection; fault localization testing; fault location; integrators; Circuit faults; Circuit testing; Delay effects; Delay estimation; Electrical fault detection; Fault detection; Fault diagnosis; Frequency; System testing; Time measurement;
Journal_Title :
Design & Test of Computers, IEEE
