Title :
IC diagnosis using multiple supply pad IDDQs
Author :
Plusquellic, Jim
Author_Institution :
Dept. of Comput. Eng., Maryland Univ., Baltimore, MD, USA
Abstract :
An IDDQ technique is proposed based on an extension of a VDDT-based method called transient signal analysis. The method, called quiescent signal analysis, uses IDDQs measured at multiple supply pins as a means of localizing defects
Keywords :
fault location; integrated circuit testing; logic testing; IC diagnosis; VDDT-based method; defects localisation; multiple supply pad IDDQs; multiple supply pins; quiescent signal analysis; transient signal analysis; Atherosclerosis; Bayesian methods; Dictionaries; Electrical resistance measurement; Performance evaluation; Pins; Signal analysis; Statistical analysis; Testing; Transient analysis;
Journal_Title :
Design & Test of Computers, IEEE
