DocumentCode :
1438826
Title :
Tensile and bending piezoelectricity of single-film PVDF monomorphs and bimorphs
Author :
Sessler, G.M. ; Berraissoul, A.
Author_Institution :
Inst. for Electroacoust., Tech. Univ. of Darmstadt, West Germany
Volume :
24
Issue :
2
fYear :
1989
fDate :
4/1/1989 12:00:00 AM
Firstpage :
249
Lastpage :
254
Abstract :
Films of 22 μm thick polyvinylidenefluoride (PVDF) are poled with partially penetrating monoenergetic electron beams, resulting in monomorph polarizations (zero polarization over part of the sample thickness and large polarization over the remaining part) or bimorph polarizations (polarization changing its sign within the sample) with corresponding distributions of piezoelectricity. Experimental data for the tensile piezoelectric strain constant d31 and the bending piezoelectric stress constant β31 with values as high as 13 pC/N and 110 nC/m, respectively, are reported. Both constants decrease with increasing energy of the electron beam. Upon annealing, d31 drops initially more rapidly than β31, whereas the opposite is true at later times. The mechanical resonance frequencies and the mechanical deflection under DC bias are discussed
Keywords :
electron beam effects; piezoelectric thin films; polymer films; 22 micron; PVDF; annealing; bending piezoelectric stress constant; bending piezoelectricity; bimorph polarizations; electron beam poling; mechanical deflection under DC bias; mechanical resonance frequencies; monomorph polarizations; penetrating monoenergetic electron beams; polymer films; polyvinylidenefluoride; tensile piezoelectric strain constant; tensile piezoelectricity; Annealing; Electron beams; Piezoelectric films; Piezoelectric polarization; Piezoelectricity; Poles and zeros; Resonance; Resonant frequency; Tensile strain; Tensile stress;
fLanguage :
English
Journal_Title :
Electrical Insulation, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9367
Type :
jour
DOI :
10.1109/14.90283
Filename :
90283
Link To Document :
بازگشت