• DocumentCode
    1438907
  • Title

    Atomistic Investigation of Low-Field Mobility in Graphene Nanoribbons

  • Author

    Betti, Alessandro ; Fiori, Gianluca ; Iannaccone, Giuseppe

  • Author_Institution
    Dipt. di Ing. dell´´Inf.: Elettron., Inf., Telecomun., Univ. di Pisa, Pisa, Italy
  • Volume
    58
  • Issue
    9
  • fYear
    2011
  • Firstpage
    2824
  • Lastpage
    2830
  • Abstract
    We have investigated the main scattering mechanisms affecting the mobility in graphene nanoribbons using detailed atomistic simulations. We have considered carrier scattering due to acoustic and optical phonons, edge roughness, single defects, and ionized impurities, and we have defined a methodology based on simulations of statistically meaningful ensembles of nanoribbon segments. Edge disorder heavily affects the mobility at room temperature in narrower nanoribbons, whereas charged impurities and phonons are hardly the limiting factors. Results are favorably compared with the few experiments available in the literature.
  • Keywords
    carrier mobility; field effect transistors; graphene; impurity scattering; nanostructured materials; phonon-impurity interactions; surface roughness; C; acoustic phonons; atomistic simulations; carrier scattering; edge disorder; edge roughness; field effect transistors; graphene nanoribbons; ionized impurities; limiting factors; low field mobility; optical phonons; single defects; temperature 293 K to 298 K; Acoustics; Computational modeling; Impurities; Optical scattering; Phonons; Resistance; Defects; edge roughness; graphene nanoribbons; impurities; low-field mobility; phonons; scattering;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2010.2100045
  • Filename
    5704569