DocumentCode
1438907
Title
Atomistic Investigation of Low-Field Mobility in Graphene Nanoribbons
Author
Betti, Alessandro ; Fiori, Gianluca ; Iannaccone, Giuseppe
Author_Institution
Dipt. di Ing. dell´´Inf.: Elettron., Inf., Telecomun., Univ. di Pisa, Pisa, Italy
Volume
58
Issue
9
fYear
2011
Firstpage
2824
Lastpage
2830
Abstract
We have investigated the main scattering mechanisms affecting the mobility in graphene nanoribbons using detailed atomistic simulations. We have considered carrier scattering due to acoustic and optical phonons, edge roughness, single defects, and ionized impurities, and we have defined a methodology based on simulations of statistically meaningful ensembles of nanoribbon segments. Edge disorder heavily affects the mobility at room temperature in narrower nanoribbons, whereas charged impurities and phonons are hardly the limiting factors. Results are favorably compared with the few experiments available in the literature.
Keywords
carrier mobility; field effect transistors; graphene; impurity scattering; nanostructured materials; phonon-impurity interactions; surface roughness; C; acoustic phonons; atomistic simulations; carrier scattering; edge disorder; edge roughness; field effect transistors; graphene nanoribbons; ionized impurities; limiting factors; low field mobility; optical phonons; single defects; temperature 293 K to 298 K; Acoustics; Computational modeling; Impurities; Optical scattering; Phonons; Resistance; Defects; edge roughness; graphene nanoribbons; impurities; low-field mobility; phonons; scattering;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2010.2100045
Filename
5704569
Link To Document