• DocumentCode
    1439053
  • Title

    Predischarge development in N2 and SF6 at high gas pressure

  • Author

    Lieberoth-Leden, B. ; Pfeiffer, W.

  • Author_Institution
    Tech. Hochschule, Darmstadt, West Germany
  • Volume
    24
  • Issue
    2
  • fYear
    1989
  • fDate
    4/1/1989 12:00:00 AM
  • Firstpage
    285
  • Lastpage
    296
  • Abstract
    The predischarge development in compressed N2 (0.1 to 0.6 MPa) and SF6 (0.1 to 0.24 MPa) has been investigated. The measurements were performed for approximately homogeneous field distribution with positive DC-voltage of up to 200 kV. Highly sensitive framing of the luminous phenomena was done with a gated microchannel image intensifier. An optical delay line allowed recording of the last 40 ns before the beginning of the voltage collapse at the gap. As about 104 emitted photons could be detected, the first records belong to the late state of the subcritical electron avalanche
  • Keywords
    electric breakdown of gases; nitrogen; sulphur compounds; 0.1 to 0.6 MPa; 200 kV; DC-voltage; N2; SF6; compressed gases; gated microchannel image intensifier; high gas pressure; homogeneous field distribution; last 40 ns; luminous phenomena; optical delay line; prebreakdown; predischarge development; subcritical electron avalanche; Delay lines; Electron emission; Electron optics; Image intensifiers; Microchannel; Optical recording; Optical sensors; Performance evaluation; Stimulated emission; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electrical Insulation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9367
  • Type

    jour

  • DOI
    10.1109/14.90300
  • Filename
    90300