Title :
Predicting Voltage Droops Using Recurring Program and Microarchitectural Event Activity
Author :
Reddi, Vijay Janapa ; Gupta, Meeta ; Holloway, Glenn ; Smith, Michael D. ; Wei, Gu-Yeon ; Brooks, David
Author_Institution :
Harvard Univ., Cambridge, MA, USA
Abstract :
Shrinking feature size and diminishing supply voltage are making circuits more sensitive to supply voltage fluctuations within a microprocessor. If left unattended, voltage fluctuations can lead to timing violations or even transistor lifetime issues. A mechanism that dynamically learns to predict dangerous voltage fluctuations based on program and microarchitectural events can help steer the processor clear of danger.
Keywords :
current fluctuations; microprocessor chips; power aware computing; timing circuits; transistor circuits; microarchitectural event activity; microprocessor; recurring program; supply voltage fluctuations; timing violations; transistor lifetime issues; voltage droops prediction; Circuits; Clocks; Energy consumption; Microarchitecture; Pipelines; Process design; Timing; Transistors; Voltage control; Voltage fluctuations; dI/dt; fault-tolerance; inductive noise; performance; reliability; voltage emergencies; voltage noise;
Journal_Title :
Micro, IEEE
