DocumentCode
1439727
Title
Mass effects of quartz resonant sensors with different surface microstructures in liquids
Author
Zhang, Chao ; Schranz, Stefan ; Lucklum, Ralf ; Hauptmann, Peter
Author_Institution
Dept. of Electr. Eng., Otto-von-Guericke-Univ., Magdeburg, Germany
Volume
45
Issue
5
fYear
1998
Firstpage
1204
Lastpage
1210
Abstract
Liquid trapped by the rough surface of a quartz resonator vibrating in thickness-shear mode (TSM) will act as a mass effect to the crystal. It has been proven that this mass effect not only depends on the liquid mass enclosed in the surface cavities, but also the liquid properties and the crystal surface features. Based on a series of experiments, this paper introduces "trapping factor" to analyze the mechanism of the liquid mass effect. Influences of different surface microstructures, including structure dimension and orientation, on the liquid mass effect have been studied on 10 MHz fundamental mode AT-cut resonators. The result indicates that the trapping factor of a chess-board structure has no advantage compared to a line-structure. For the same structure height of 0.4 /spl mu/m, the mass effect of a crystal with about 3 /spl mu/m distance line-structure is bigger than that of a 7.5 /spl mu/m distance line-structure. With a similar surface roughness value (R/sub a/), the crystal with a line structured surface has a much bigger mass effect than that with a randomly rough surface.
Keywords
crystal resonators; electric sensing devices; surface topography; 0.4 mum; 10 MHz; 3 mum; 7.5 mum; AT-cut resonators; SiO/sub 2/; chess-board structure; crystal surface; line structured surface; liquid mass; liquid mass effect; mass effect; quartz resonant sensors; quartz resonator; rough surface; surface cavities; surface microstructures; thickness-shear mode; trapping factor; Acoustic propagation; Acoustic waves; Crystal microstructure; Damping; Electrical capacitance tomography; Frequency; Resonance; Rough surfaces; Surface acoustic waves; Surface roughness;
fLanguage
English
Journal_Title
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
Publisher
ieee
ISSN
0885-3010
Type
jour
DOI
10.1109/58.726444
Filename
726444
Link To Document