• DocumentCode
    1439844
  • Title

    A Large-Signal Graphene FET Model

  • Author

    Habibpour, Omid ; Vukusic, Josip ; Stake, Jan

  • Author_Institution
    Dept. of Microtechnol. & Nanosci., Chalmers Univ. of Technol., Goteborg, Sweden
  • Volume
    59
  • Issue
    4
  • fYear
    2012
  • fDate
    4/1/2012 12:00:00 AM
  • Firstpage
    968
  • Lastpage
    975
  • Abstract
    We propose a semi-empirical graphene field-effect-transistor (G-FET) model for analysis and design of G-FET-based circuits. The model describes the current-voltage characteristic for a G-FET over a wide range of operating conditions. The gate bias dependence of the output power spectrum is studied and compared with the simulated values. Good agreement between the simulated and the experimental power spectrums up to the third harmonic is demonstrated, which confirms the model validity. Moreover, S-parameter measurements essentially coincide with the results obtained from the simulation. The model contains a small set of fitting parameters, which can be straightforwardly extracted from S-parameters and dc measurements. The developed extraction method gives a more accurate estimation of the drain and source contact resistances compared with other approaches. As a design example, we use a harmonic balance load-pull approach to extract optimum embedding impedance values for a subharmonic G-FET mixer.
  • Keywords
    S-parameters; field effect transistors; graphene; harmonics; simulation; G-FET model; S-parameter measurements; harmonic balance load-pull approach; large-signal graphene FET model; semi-empirical graphene field-effect-transistor model; simulation; Analytical models; Charge carrier processes; Electrical resistance measurement; Integrated circuit modeling; Logic gates; Mathematical model; Scattering parameters; Graphene; harmonic balance analysis; microwave field-effect transistors (FETs); semiconductor device modeling; subharmonic mixer;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2012.2182675
  • Filename
    6145637