DocumentCode
1439939
Title
What is the Young´s Modulus of Silicon?
Author
Hopcroft, Matthew A. ; Nix, William D. ; Kenny, Thomas W.
Author_Institution
Dept. of Mech. Eng., Univ. of California at Berkeley, Berkeley, CA, USA
Volume
19
Issue
2
fYear
2010
fDate
4/1/2010 12:00:00 AM
Firstpage
229
Lastpage
238
Abstract
The Young´s modulus (E) of a material is a key parameter for mechanical engineering design. Silicon, the most common single material used in microelectromechanical systems (MEMS), is an anisotropic crystalline material whose material properties depend on orientation relative to the crystal lattice. This fact means that the correct value of E for analyzing two different designs in silicon may differ by up to 45%. However, perhaps, because of the perceived complexity of the subject, many researchers oversimplify silicon elastic behavior and use inaccurate values for design and analysis. This paper presents the best known elasticity data for silicon, both in depth and in a summary form, so that it may be readily accessible to MEMS designers.
Keywords
Young´s modulus; crystal orientation; elasticity; elemental semiconductors; micromechanical devices; silicon; MEMS; Si; Young´s modulus; anisotropic crystalline material; elasticity; microelectromechanical systems; silicon; Elastic modulus; Poisson´s ratio; Young´s modulus; elasticity; microelectromechanical systems (MEMS) design; shear modulus; silicon;
fLanguage
English
Journal_Title
Microelectromechanical Systems, Journal of
Publisher
ieee
ISSN
1057-7157
Type
jour
DOI
10.1109/JMEMS.2009.2039697
Filename
5430873
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