• DocumentCode
    1439939
  • Title

    What is the Young´s Modulus of Silicon?

  • Author

    Hopcroft, Matthew A. ; Nix, William D. ; Kenny, Thomas W.

  • Author_Institution
    Dept. of Mech. Eng., Univ. of California at Berkeley, Berkeley, CA, USA
  • Volume
    19
  • Issue
    2
  • fYear
    2010
  • fDate
    4/1/2010 12:00:00 AM
  • Firstpage
    229
  • Lastpage
    238
  • Abstract
    The Young´s modulus (E) of a material is a key parameter for mechanical engineering design. Silicon, the most common single material used in microelectromechanical systems (MEMS), is an anisotropic crystalline material whose material properties depend on orientation relative to the crystal lattice. This fact means that the correct value of E for analyzing two different designs in silicon may differ by up to 45%. However, perhaps, because of the perceived complexity of the subject, many researchers oversimplify silicon elastic behavior and use inaccurate values for design and analysis. This paper presents the best known elasticity data for silicon, both in depth and in a summary form, so that it may be readily accessible to MEMS designers.
  • Keywords
    Young´s modulus; crystal orientation; elasticity; elemental semiconductors; micromechanical devices; silicon; MEMS; Si; Young´s modulus; anisotropic crystalline material; elasticity; microelectromechanical systems; silicon; Elastic modulus; Poisson´s ratio; Young´s modulus; elasticity; microelectromechanical systems (MEMS) design; shear modulus; silicon;
  • fLanguage
    English
  • Journal_Title
    Microelectromechanical Systems, Journal of
  • Publisher
    ieee
  • ISSN
    1057-7157
  • Type

    jour

  • DOI
    10.1109/JMEMS.2009.2039697
  • Filename
    5430873