• DocumentCode
    1439949
  • Title

    A Wideband and Compact Partial Electromagnetic Bandgap Structure With a Narrow Via Pitch for a Signal Via Shield

  • Author

    Hwang, Chulsoon ; Kim, Jaemin ; Song, Eakhwan ; Shim, Yujeong ; Kim, Joungho

  • Author_Institution
    Dept. of Electr. Eng., Korea Adv. Inst. of Sci. & Technol. (KAIST), Daejeon, South Korea
  • Volume
    53
  • Issue
    1
  • fYear
    2011
  • Firstpage
    241
  • Lastpage
    244
  • Abstract
    A wideband and compact partial electromagnetic bandgap (PEBG) structure and a corresponding stopband-estimation model are proposed for the suppression of simultaneous switching noise (SSN) coupling in a multilayer printed circuit board. The proposed PEBG structure achieves a wide stopband with a compact size by adopting a geometric arrangement of patches that allows for a periodic narrow via pitch (NVP). In addition, the lumped capacitance model of the previously reported effective phase constant equation is replaced with the resonant cavity model to obtain the precise impedance of the patch in high frequency. Finally, it was successfully verified that, by applying the NVP-PEBG structure, wideband suppression of SSN coupling to the signal via is achieved with a bandwidth of 11.2 GHz below -40 dB. The proposed estimation model was validated through experimental measurements.
  • Keywords
    circuit noise; electromagnetic interference; electromagnetic shielding; printed circuits; switching; compact partial electromagnetic bandgap structure stopband-estimation model; multilayer printed circuit board; periodic narrow via pitch; resonant cavity; signal via shield; simultaneous switching noise coupling; wideband partial electromagnetic bandgap structure; Capacitance; Couplings; Estimation; Impedance; Metamaterials; Noise; Periodic structures; Electromagnetic bandgap (EBG); partial EBG (PEBG); simultaneous switching noise (SSN); via shield;
  • fLanguage
    English
  • Journal_Title
    Electromagnetic Compatibility, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9375
  • Type

    jour

  • DOI
    10.1109/TEMC.2010.2065234
  • Filename
    5705569