DocumentCode
1440030
Title
A 1.8-ns access, 550-MHz, 4.5-Mb CMOS SRAM
Author
Nambu, Hiroaki ; Kanetani, Kazuo ; Yamasaki, Kaname ; Higeta, Keiichi ; Usami, Masami ; Fujimura, Yasuhiro ; Ando, Kazumasa ; Kusunoki, Takeshi ; Yamaguchi, Kunihiko ; Homma, Noriyuki
Author_Institution
Central Res. Lab., Hitachi Ltd., Tokyo, Japan
Volume
33
Issue
11
fYear
1998
fDate
11/1/1998 12:00:00 AM
Firstpage
1650
Lastpage
1658
Abstract
An ultrahigh-speed 4.5-Mb CMOS SRAM with 1.8-ns clock-access time, 1.8-ns cycle time, and 9.84-μm2 memory cells has been developed using 0.25-μm CMOS technology. Three key circuit techniques for achieving this high speed are a decoder using source-coupled-logic (SCL) circuits combined with reset circuits, a sense amplifier with nMOS source followers, and a sense-amplifier activation-pulse generator that uses a duplicate memory-cell array. The proposed decoder can reduce the delay time between the address input and the word-line signal of the 4.5-Mb SRAM to 68% of that of an SRAM with conventional circuits. The sense amplifier with nMOS source followers can reduce not only the delay time of the sense amplifier but also the power dissipation. In the SRAM, the sense-amplifier activation pulse must be input into the sense amplifier after the signal from the memory cell is input into the sense amplifier. A large timing margin required between these signals results in a large access time in the conventional SRAM. The sense-amplifier activation pulse generator that uses a duplicate memory-cell array can reduce the required timing margin to less than half of the conventional margin. These three techniques are especially useful for realizing ultrahigh-speed SRAM´s, which will be used as on-chip or off-chip cache memories in processor systems
Keywords
CMOS memory circuits; SRAM chips; cache storage; decoding; timing; 0.25 micron; 1.8 ns; 4.5 Mbit; 550 MHz; CMOS SRAM; SCL circuits; activation-pulse generator; decoder; duplicate memory-cell array; nMOS source followers; offchip cache memories; onchip cache memories; reset circuits; sense amplifier; source-coupled-logic circuits; timing margin reduction; ultrahigh-speed static RAM; CMOS technology; Circuits; Clocks; Decoding; Delay effects; MOS devices; Power amplifiers; Pulse amplifiers; Random access memory; Timing;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/4.726553
Filename
726553
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