• DocumentCode
    1440087
  • Title

    500-Mb/s nonprecharged data bus for high-speed DRAM´s

  • Author

    Saito, Miyoshi ; Ogawa, Junji ; Tamura, Hirotaka ; Wakayama, Shigetoshi ; Araki, Hisakatsu ; Cheung, Tsz-Shing ; Gotoh, Kohtaroh ; Aikawa, Tadao ; Suzuki, Takaaki ; Taguchi, Masao ; Imamura, Takeshi

  • Author_Institution
    Syst LSI Dev. Labs., Fujitsu Labs. Ltd., Kawasaki, Japan
  • Volume
    33
  • Issue
    11
  • fYear
    1998
  • fDate
    11/1/1998 12:00:00 AM
  • Firstpage
    1720
  • Lastpage
    1730
  • Abstract
    A nonprecharged data-bus scheme to enhance the intrinsic read data rate of DRAM cores is proposed. Eliminating the precharge cycle of the DRAM data bus can reduce the unit bit time. A differential partial response detection data-bus amplifier is also employed to detect signals on the nonprecharged data bus that are degraded by large intersymbol interference. To enhance the read operation further, column selections are overlapped by interleaved column decoders. To increase the operating margin of the nonprecharged data-bus read, a skew-controlled column-selection pulse generator was developed. An isolated sense-amplifier scheme increases the write data rate of the DRAM core. To verify these schemes, a 4-Mb DRAM was fabricated via 0.24-μm DRAM technology. These schemes realized a 500-Mb/s per data-bus read operation and a 100-Mb/s per data-bus write operation without an area penalty
  • Keywords
    DRAM chips; decoding; intersymbol interference; memory architecture; partial response channels; pulse generators; 0.24 micron; 4 Mbit; 400 Mbit/s; 500 Mbit/s; DRAM cores; column selections; data-bus read; data-bus write; differential partial response detection data-bus amplifier; interleaved column decoders; intersymbol interference; intrinsic read data rate; isolated sense-amplifier scheme; nonprecharged data bus; operating margin; skew-controlled column-selection pulse generator; unit bit time; write data rate; Decoding; Degradation; Differential amplifiers; Intersymbol interference; Laboratories; Large scale integration; Pulse amplifiers; Pulse generation; Random access memory; Signal detection;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/4.726566
  • Filename
    726566