• DocumentCode
    1440103
  • Title

    A process-independent, 800-MB/s, DRAM byte-wide interface featuring command interleaving and concurrent memory operation

  • Author

    Griffin, Matthew M. ; Zerbe, Jared ; Tsang, Grace ; Ching, Michael ; Portmann, Clemenz L.

  • Author_Institution
    Rambus Inc., Mountain View, CA, USA
  • Volume
    33
  • Issue
    11
  • fYear
    1998
  • fDate
    11/1/1998 12:00:00 AM
  • Firstpage
    1741
  • Lastpage
    1751
  • Abstract
    An 800-MB/s/pin byte-wide interface DRAM is described that meets the bandwidth requirements for modern microprocessor systems. Clock recovery and I/O circuitry perform to specification across multiple DRAM manufacturers´ processes. The clock-recovery circuitry is described in depth for areas that are sensitive to power-supply noise. I/O circuitry for preserving signal integrity in high-speed bussed systems is described. Design methodology that enables rapid simulation and verification of the design in each fabrication process is discussed. Logic that enables interleaved transactions with concurrent operation is detailed. Computer-aided-design tools for large aspect merged logic/memory are discussed. Last, measured results are summarized showing clock jitter, setup and hold timing, and period versus Vdd operation
  • Keywords
    DRAM chips; circuit analysis computing; clocks; digital simulation; integrated circuit noise; jitter; 800 MB/s; DRAM byte-wide interface; I/O circuitry; bandwidth requirements; clock jitter; clock recovery; command interleaving; concurrent memory operation; concurrent operation; high-speed bussed systems; hold timing; interleaved transactions; merged logic/memory; microprocessor systems; power-supply noise; rapid simulation; signal integrity; Bandwidth; Circuit noise; Circuit simulation; Clocks; Computational modeling; Design methodology; Logic; Manufacturing processes; Microprocessors; Random access memory;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/4.726569
  • Filename
    726569