Title :
Structural Analysis of a Prototype Fast Shutter for ITER cCXRS Diagnostic
Author :
Panin, A. ; Biel, W. ; Krasikov, Y. ; Neubauer, O. ; Bardawil, D. A Castaño
Author_Institution :
IEK4-Plasma Phys., Forschungszentrum Julich GmbH, Julich, Germany
fDate :
3/1/2012 12:00:00 AM
Abstract :
Optical lifetime of the first mirror is a critical issue for the ITER upper-port-plug core-charge-exchange-spectroscopy diagnostic. A fast shutter is engaged to protect the mirror from depositions between measurements. The prototype shutter will be examined in a test vacuum vessel that is now under development in Forschungszentrum Jülich, Germany. Being located near the plasma, the shutter operates under severe thermal and electromagnetic (EM) loads. The multifield analyses conducted for the shutter are presented in this paper. Since the fast shutter can operate within 0.7 s, its static structural analysis should be accompanied by dynamic studies. This paper gives details about the numerical strategy used for a multifield ANSYS modeling of a complex structure. The shutter structural performance under the service, thermal, and EM loadings is in line with the requirements. A solution for a problem of high local thermostresses revealed by the analysis is proposed. Problems connected with other possible port-plug-shutter layouts are discussed.
Keywords :
Tokamak devices; mirrors; numerical analysis; plasma diagnostics; plasma toroidal confinement; thermal stresses; ITER upper-port-plug core-charge-exchange-spectroscopy diagnostic; complex structure; dynamic studies; electromagnetic load; local thermostresses; mirror; multifield ANSYS modeling; multifield analyses; numerical strategy; optical lifetime; prototype fast shutter; severe thermal load; shutter structural performance; static structural analysis; structural analysis; test vacuum vessel; time 0.7 s; Actuators; Blades; Electron tubes; Load modeling; Loading; Numerical models; Stress; ITER; multifield analyses; shutter; upper-port-plug diagnostic;
Journal_Title :
Plasma Science, IEEE Transactions on
DOI :
10.1109/TPS.2012.2182782