DocumentCode
1440452
Title
Stationary Mode Distribution and Sidewall Roughness Effects in Overmoded Optical Waveguides
Author
Di Donato, Andrea ; Farina, Marco ; Mencarelli, Davide ; Lucesoli, Agnese ; Fabiani, Silvia ; Rozzi, Tullio ; Di Gregorio, Giordano M. ; Angeloni, Giacomo
Author_Institution
Dept. of Electromagn., Polytech. Univ. of Marche, Ancona, Italy
Volume
28
Issue
10
fYear
2010
fDate
5/15/2010 12:00:00 AM
Firstpage
1510
Lastpage
1520
Abstract
In this paper, the authors investigate analytically the transformation from the initial guided mode distribution to the stationary state and the effects of the bidimensional roughness profile, in multimode polymeric buried waveguides. In these structures, due to the geometrical dimensions and the operating wavelength, about a thousands of guided modes can propagate, even for weak core/cladding dielectric contrast. The coupling coefficients are computed by exploiting the geometrical features of the optical channels, such as the waveguide dimensions and the roughness surface statistics. The analysis gives insight on the guided/guided and guided/radiated mode interaction, and higher order solution is proposed, in the case of a great number of modes interacting over distances that are extremely long as compared to the signal wavelength and the roughness correlation length. Experimental results are valuated by means of semicontact atomic force microscopy as well as compared with existing numerical models.
Keywords
atomic force microscopy; claddings; optical polymers; optical waveguides; surface roughness; bidimensional roughness profile; cladding dielectric contrast; coupling coefficient; guided mode distribution; multimode polymeric buried waveguides; optical channels; overmoded optical waveguides; roughness correlation length; semicontact atomic force microscopy; sidewall roughness effects; stationary mode distribution; Multimode polymeric waveguide; optical interconnections; optical printed circuit board (PCB);
fLanguage
English
Journal_Title
Lightwave Technology, Journal of
Publisher
ieee
ISSN
0733-8724
Type
jour
DOI
10.1109/JLT.2010.2045154
Filename
5430946
Link To Document