• DocumentCode
    1440978
  • Title

    Low-Noise Amplifier Design With Dual Reactive Feedback for Broadband Simultaneous Noise and Impedance Matching

  • Author

    Fu, Chang-tsung ; Kuo, Chien-Nan ; Taylor, Stewart S.

  • Author_Institution
    Dept. of Electron. Eng., Nat. ChiaoTung Univ., Hsinchu, Taiwan
  • Volume
    58
  • Issue
    4
  • fYear
    2010
  • fDate
    4/1/2010 12:00:00 AM
  • Firstpage
    795
  • Lastpage
    806
  • Abstract
    The simultaneous noise and impedance matching (SNIM) condition for a common-source amplifier is analyzed. Transistor noise parameters are derived based on the more complete hybrid-?? model, and the dominant factors jeopardizing SNIM are identified. Strategies for narrowband and broadband SNIM (BSNIM) are derived accordingly. A dual reactive feedback circuit along with an LC-ladder matching network is proposed to achieve the BSNIM. It includes a capacitive and an inductive feedback, where the former utilizes the transistor parasitic gate-to-drain capacitance and the latter is formed by transformer coupling. This circuit topology has been validated in 0.18- and 0.13- ??m CMOS technologies for a 3-11-GHz ultra-wideband (UWB) and a 2.4-5.4-GHz multistandard application, respectively. The 3-11-GHz UWB low-noise amplifier is detailed as a design example.
  • Keywords
    CMOS integrated circuits; feedback amplifiers; impedance matching; low noise amplifiers; network topology; ultra wideband technology; CMOS technologies; broadband simultaneous noise; circuit topology; common-source amplifier; dual reactive feedback; impedance matching; low-noise amplifier design; multistandard application; transistor noise parameters; ultrawideband application; Broadband input matching; capacitive feedback; low power; low-noise amplifier (LNA); noise optimized design; simultaneous noise and impedance matching (SNIM); transformer feedback; ultra-wideband (UWB);
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/TMTT.2010.2041570
  • Filename
    5431031