DocumentCode :
1441031
Title :
Arc erosion behaviour of silver electric contacts in a single arc discharge across a static gap
Author :
Lee, R.-T. ; Chung, H.-H. ; Chiou, Y.-C.
Author_Institution :
Dept. of Mech. Eng., Nat. Sun Yat-Sen Univ., Kaohsiung, Taiwan
Volume :
148
Issue :
1
fYear :
2001
fDate :
1/1/2001 12:00:00 AM
Firstpage :
8
Lastpage :
14
Abstract :
Static-gap electrical erosion experiments are conducted using an iron needle cathode and silver anode, where the gap distance can be adjusted with high precision and high accuracy. The effects of supply voltage and gap distance on the arc erosion behaviour are investigated in a single arc discharge. Results show that the air breakdown occurs at 70 V/μm up to 175 V, at 330 V at 10 μm, and 500 V at 40 μm. Since the gap distance increases with increasing arc duration, the residual voltage is always positive at a smaller gap distance with lower supply voltage. However, a negative residual voltage occurs at a larger supply voltage. This negative residual voltage is caused by positive metallic ions accumulated on the cathode. The particle sputtering-deposition model can reasonably explain this negative residual voltage. With increasing gap distance, the erosion area increases and reaches a maximum. However, it diminishes at higher supply voltages due to the increased amount of gaseous phase arc. It is seen from the eroded anode surface that the metallic phase are mainly causes the crater with many strip-like metallic particles, but the gaseous phase are significantly results in a lot of silver powder
Keywords :
arcs (electric); electrical contacts; iron; silver; wear; 10 μm; 10 muA; 175 V; 330 V; 40 μm; 40 muA; 500 V; Ag; Ag anode; Ag electric contacts; Ag powder; Fe; Fe needle cathode; erosion; gap distance; gaseous phase arc; negative residual voltage; particle sputtering-deposition model; positive metallic ions; single arc discharge; strip-like metallic particles;
fLanguage :
English
Journal_Title :
Science, Measurement and Technology, IEE Proceedings -
Publisher :
iet
ISSN :
1350-2344
Type :
jour
DOI :
10.1049/ip-smt:20010181
Filename :
903468
Link To Document :
بازگشت