Dielectric characterization of printed circuit board substrates

Author

Riedell, C. Heyward ; Steer, Michael B. ; Kay, Mike R. ; Kasten, Jefferey S. ; Basel, Mark S. ; Pomerleau, Real

Author_Institution

BNR Research Triangle Park, NC, USA

Volume

39

Issue

2

fYear

1990

fDate

4/1/1990 12:00:00 AM

Firstpage

437

Lastpage

440

Abstract

The design and quality assurance of high-speed digital systems require a fast and accurate method for the electrical characterization of printed circuit substrates. A novel technique is presented for measuring the dielectric properties of such substrates based on the measured scattering parameters of a transmission line. The method is broadband, determines the effective permittivity and loss tangent, and is compatible with existing substrate quality assurance schemes. Comparisons with alternative permittivity characterization techniques are presented. Results of this technique compare favorably with those of the coaxial reflection and strip resonator methods

Keywords

S-parameters; dielectric measurement; printed circuit testing; quality control; substrates; dielectric properties; effective permittivity; high-speed digital systems; loss tangent; printed circuit board substrates; quality assurance; scattering parameters; transmission line; Coaxial components; Dielectric measurements; Dielectric substrates; Digital systems; Distributed parameter circuits; Permittivity measurement; Printed circuits; Quality assurance; Scattering parameters; Transmission line measurements;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/19.52532

Filename

52532