Characterization of single-event upsets in a flash analog-to-digital converter (AD9058)

Author

Buchner, Stephen P. ; Meehan, Timothy J. ; Campbell, Arthur B. ; Clark, Kenny A. ; McMorrow, Dale

Author_Institution

SFA Inc., Largo, MD, USA

Volume

47

Issue

6

fYear

2000

fDate

12/1/2000 12:00:00 AM

Firstpage

2358

Lastpage

2364

Abstract

Single-event upsets were observed in a flash analog-to-digital converter (AD9058) included as part of a radiation effects experiment on board a satellite. The origins of the upsets were identified using a pulsed laser and confirmed by exposing the AD9058 to both heavy ions and protons at accelerator facilities. The salient result of this work is that the single-event-upset cross-section depends on the value of the analog input but does not appear to depend on clock frequency. Therefore, using a single value for the analog input during ground testing may give an incorrect estimate of the error rate expected during operation in space where the input can vary over the full voltage range

Keywords

analogue-digital conversion; ion beam effects; laser beam effects; proton effects; space vehicle electronics; AD9058; clock frequency; error rate; flash analog-to-digital converter; ground testing; heavy ion irradiation; proton irradiation; pulsed laser irradiation; radiation effects; single-event-upset cross-section; space environment; Analog-digital conversion; Clocks; Error analysis; Frequency; Ion accelerators; Optical pulses; Proton accelerators; Radiation effects; Satellites; Testing;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/23.903777

Filename

903777