DocumentCode :
1441564
Title :
Electron collision dose enhancement
Author :
Solin, John R.
Author_Institution :
Lockheed Martin Missiles & Space, San Jose, CA, USA
Volume :
47
Issue :
6
fYear :
2000
fDate :
12/1/2000 12:00:00 AM
Firstpage :
2447
Lastpage :
2450
Abstract :
High-Z layers in IC packages and on IC die slow and reflect incident electron fluxes much more effectively than low-Z layers. In typical nuclear and space environments, high-Z solder bonds can enhance the electron collision dose by up to 85%, and Au-plated lids can enhance it by up to 50%
Keywords :
cosmic ray interactions; electron beam effects; integrated circuit packaging; nuclear electronics; space vehicle electronics; IC die; IC packages; high-Z layers; incident electron fluxes; nuclear environments; plated lids; solder bonds; space environments; Atomic layer deposition; Backscatter; Ceramics; Electron beams; Geometry; Integrated circuit packaging; Metallization; Optical reflection; Silicides; Slabs;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/23.903791
Filename :
903791
Link To Document :
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