Title :
Analysis of single-event effects in combinational logic-simulation of the AM2901 bitslice processor
Author :
Massengill, L.W. ; Baranski, A.E. ; Van Nort, D.O. ; Meng, J. ; Bhuva, B.L.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Vanderbilt Univ., Nashville, TN, USA
fDate :
12/1/2000 12:00:00 AM
Abstract :
Using SEUTool (a synthesized VHDL based simulator of single-event fault propagation in combinational circuitry), we have performed a single-event study on a custom-designed CMOS AM2901, a 4-bit bit-slice processor. Analysis shows interesting general trends for single-event upset effects in complex combinational/sequential circuits
Keywords :
bit-slice computers; circuit simulation; fault simulation; hardware description languages; logic simulation; microprocessor chips; radiation effects; 4 bit; AM2901 bitslice processor; SEUTool; VHDL based simulator; combinational circuitry; combinational logic; custom design; fault propagation; sequential circuits; single-event effects; upset effects; CMOS logic circuits; Circuit faults; Circuit simulation; Clocks; Combinational circuits; Latches; Microprocessors; Registers; Semiconductor device modeling; Sequential circuits;
Journal_Title :
Nuclear Science, IEEE Transactions on
