Title :
Analysis of single-event transients in analog circuits
Author :
Adell, P. ; Schrimpf, R.D. ; Barnaby, H.J. ; Marec, R. ; Chatry, C. ; Calvel, P. ; Barillot, C. ; Mion, O.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Vanderbilt Univ., Nashville, TN, USA
fDate :
12/1/2000 12:00:00 AM
Abstract :
A new methodology for understanding single-event transient (SET) phenomena in analog circuits is described. Device and circuit simulation techniques are coupled in order to reproduce experimental data obtained from the National Semiconductor LM124 operational amplifier and to determine the most sensitive parts of the integrated circuit. Experimental data obtained at the Physical Nuclear Institute from a low-power voltage regulator that uses the LM124 are also used to illustrate the method
Keywords :
analogue integrated circuits; circuit simulation; integrated circuit measurement; low-power electronics; operational amplifiers; radiation effects; transient analysis; voltage regulators; National Semiconductor LM124 operational amplifier; Physical Nuclear Institute; analog circuits; circuit simulation techniques; low-power voltage regulator; single-event transients; Aerospace industry; Analog circuits; Circuit simulation; Circuit testing; Operational amplifiers; Semiconductor optical amplifiers; Space vehicles; System testing; Transient analysis; Voltage;
Journal_Title :
Nuclear Science, IEEE Transactions on
