Analysis of single-event transients in analog circuits

Author

Adell, P. ; Schrimpf, R.D. ; Barnaby, H.J. ; Marec, R. ; Chatry, C. ; Calvel, P. ; Barillot, C. ; Mion, O.

Author_Institution

Dept. of Electr. Eng. & Comput. Sci., Vanderbilt Univ., Nashville, TN, USA

Volume

47

Issue

6

fYear

2000

fDate

12/1/2000 12:00:00 AM

Firstpage

2616

Lastpage

2623

Abstract

A new methodology for understanding single-event transient (SET) phenomena in analog circuits is described. Device and circuit simulation techniques are coupled in order to reproduce experimental data obtained from the National Semiconductor LM124 operational amplifier and to determine the most sensitive parts of the integrated circuit. Experimental data obtained at the Physical Nuclear Institute from a low-power voltage regulator that uses the LM124 are also used to illustrate the method

Keywords

analogue integrated circuits; circuit simulation; integrated circuit measurement; low-power electronics; operational amplifiers; radiation effects; transient analysis; voltage regulators; National Semiconductor LM124 operational amplifier; Physical Nuclear Institute; analog circuits; circuit simulation techniques; low-power voltage regulator; single-event transients; Aerospace industry; Analog circuits; Circuit simulation; Circuit testing; Operational amplifiers; Semiconductor optical amplifiers; Space vehicles; System testing; Transient analysis; Voltage;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/23.903817

Filename

903817