A model for single-event transients in comparators

Author

Johnston, A.H. ; Swift, G.M. ; Miyahira, T.F. ; Edmonds, L.D.

Author_Institution

Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA

Volume

47

Issue

6

fYear

2000

fDate

12/1/2000 12:00:00 AM

Firstpage

2624

Lastpage

2633

Abstract

A two-step modeling approach is developed for single-event transients in linear circuits that uses the PISCES device simulation program to calculate transient currents in key internal transistor structures. Those currents are then applied at the circuit level using the SPICE circuit analysis program. The results explain the dependence of transients on input differential voltage, as well as the dependence of transient signals on output loading conditions. Error rate predictions based on laboratory testing and modeling are in close agreement with the observed number of “trips” in comparators within power control modules that have operated in a deep space environment for nearly three years

Keywords

SPICE; analogue integrated circuits; comparators (circuits); integrated circuit modelling; ion beam effects; radiation hardening (electronics); space vehicle electronics; transients; Darlington configuration; PISCES device simulation program; SPICE circuit analysis program; comparators; deep space environment; error rate predictions; heavy ion tests; input differential voltage dependence; internal transistor structures; linear circuits; number of trips; output loading conditions; power control modules; single-event transients; threshold LET; transient currents; two-step modeling approach; Circuit analysis; Circuit simulation; Circuit testing; Linear circuits; Multichip modules; Operational amplifiers; Propulsion; SPICE; Space technology; Voltage;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/23.903818

Filename

903818