DocumentCode :
1441866
Title :
A two-dimensional beam profile monitor based on residual gas ionization
Author :
Shapira, D. ; Lewis, T.A.
Author_Institution :
Div. of Phys., Oak Ridge Nat. Lab., TN, USA
Volume :
47
Issue :
6
fYear :
2000
fDate :
12/1/2000 12:00:00 AM
Firstpage :
1969
Lastpage :
1973
Abstract :
A two-dimensional beam profile monitor based on tracking the ionization of the residual gas molecules in the evacuated beam pipe is described. Tracking in position and time of the ions and electrons produced in the ionization enables simultaneous position sampling in three dimensions. Special features which make it possible to sample very low beam currents were employed
Keywords :
ionisation; particle beam diagnostics; evacuated beam pipe; residual gas ionization; residual gas molecules; simultaneous position sampling; two-dimensional beam profile monitor; very low beam currents; Detectors; Electrodes; Electron beams; Ion beams; Ionization; Microchannel; Monitoring; Particle beams; Sampling methods; Structural beams;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/23.903830
Filename :
903830
Link To Document :
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