Position of ion impact determined via detection of secondary electrons

Author

Shapira, D. ; Lewis, T.A.

Author_Institution

Div. of Phys., Oak Ridge Nat. Lab., TN, USA

Volume

47

Issue

6

fYear

2000

fDate

12/1/2000 12:00:00 AM

Firstpage

1974

Lastpage

1978

Abstract

The factors affecting the performance of a Position Sensitive Timing Detector (PSTD), which is based on detecting secondary electrons rejected from a foil by the passing ion in a position sensitive detection device, were investigated. We studied effects of multiple scattering in the foil, electron transport from the foil to the micro-channel plate (MCP) detector surface, and signal processing hardware. We conclude that, for detectors with foil-to-MCP distance of 5-10 cm, which use only electrostatic acceleration, electron transport limits the devices currently in use to resolution worse than 2 mm (FWHM)

Keywords

nuclear electronics; position sensitive particle detectors; proportional counters; secondary electron emission; signal processing; Position Sensitive Timing Detector; electron transport; electrostatic acceleration; ion impact; micro-channel plate detector surface; multiple scattering; passing ion; position sensitive detection device; secondary electrons detection; signal processing hardware; Acceleration; Anodes; Electron emission; Electrostatics; Laboratories; Particle scattering; Position sensitive particle detectors; Shape control; Signal processing; Timing;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/23.903831

Filename

903831