DocumentCode
144224
Title
Sift-ELM approach for unsupervised change detection in VHR images
Author
Alhichri, Haikel
Author_Institution
Dept. of Comput. Eng., King Saud Univ., Riyadh, Saudi Arabia
fYear
2014
fDate
13-18 July 2014
Firstpage
4699
Lastpage
4702
Abstract
This paper proposes a novel method for unsupervised change detection that is based on the Scale Invariant Feature Transform (SIFT) key points detector and the Extreme Learning Machine (ELM) classifier. The method starts by extracting SIFT key points from both images, and then matches them using the RANSAC algorithm. The matched key points based on the RANSAC algorithm are viewed as training points for the no-change class. As for the change class key points, we select them from the remaining SIFT key points extracted from the two images. The points selected are then used to train an ELM classifier. Finally, the classification map is enhanced using the Level Set segmentation algorithm. Experimental, results performed on two VHR datasets confirm the novelty of this method and its effectiveness.
Keywords
image classification; image segmentation; ELM classifier; Extreme Learning Machine; Level Set segmentation algorithm; RANSAC algorithm; SIFT key points detector; SIFT-ELM approach; Scale Invariant Feature Transform; VHR datasets; VHR images; classification map; unsupervised change detection; Classification algorithms; Detectors; Feature extraction; Image segmentation; Remote sensing; Spatial resolution; Training; Change detection (CD); Extreme Learning Machine (ELM); Scale Invariant Feature Transform (SIFT); very high resolution (VHR);
fLanguage
English
Publisher
ieee
Conference_Titel
Geoscience and Remote Sensing Symposium (IGARSS), 2014 IEEE International
Conference_Location
Quebec City, QC
Type
conf
DOI
10.1109/IGARSS.2014.6947542
Filename
6947542
Link To Document