• DocumentCode
    144224
  • Title

    Sift-ELM approach for unsupervised change detection in VHR images

  • Author

    Alhichri, Haikel

  • Author_Institution
    Dept. of Comput. Eng., King Saud Univ., Riyadh, Saudi Arabia
  • fYear
    2014
  • fDate
    13-18 July 2014
  • Firstpage
    4699
  • Lastpage
    4702
  • Abstract
    This paper proposes a novel method for unsupervised change detection that is based on the Scale Invariant Feature Transform (SIFT) key points detector and the Extreme Learning Machine (ELM) classifier. The method starts by extracting SIFT key points from both images, and then matches them using the RANSAC algorithm. The matched key points based on the RANSAC algorithm are viewed as training points for the no-change class. As for the change class key points, we select them from the remaining SIFT key points extracted from the two images. The points selected are then used to train an ELM classifier. Finally, the classification map is enhanced using the Level Set segmentation algorithm. Experimental, results performed on two VHR datasets confirm the novelty of this method and its effectiveness.
  • Keywords
    image classification; image segmentation; ELM classifier; Extreme Learning Machine; Level Set segmentation algorithm; RANSAC algorithm; SIFT key points detector; SIFT-ELM approach; Scale Invariant Feature Transform; VHR datasets; VHR images; classification map; unsupervised change detection; Classification algorithms; Detectors; Feature extraction; Image segmentation; Remote sensing; Spatial resolution; Training; Change detection (CD); Extreme Learning Machine (ELM); Scale Invariant Feature Transform (SIFT); very high resolution (VHR);
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Geoscience and Remote Sensing Symposium (IGARSS), 2014 IEEE International
  • Conference_Location
    Quebec City, QC
  • Type

    conf

  • DOI
    10.1109/IGARSS.2014.6947542
  • Filename
    6947542