Title :
Long-term behavior of operational amplifiers
Author :
Rubiola, Enrico ; Francese, Claudio ; De Marchi, Andrea
Author_Institution :
ESSTIN, Vandoeuvre Les Nancy, France
fDate :
2/1/2001 12:00:00 AM
Abstract :
The voltage and current offsets of two typical precision operational amplifiers (OPAs) with BJT and FET input, respectively, were continuously measured for two years. The paper presents the experiment, explains the method of data analysis, and discusses the results. The long-term stability turns out to be limited mainly by random walk processes
Keywords :
CMOS analogue integrated circuits; bipolar analogue integrated circuits; flicker noise; integrated circuit noise; operational amplifiers; thermal noise; BJT amplifiers; FET amplifiers; ageing; current offsets; flicker parameters; long-term behavior; long-term stability; operational amplifiers; precision amplifiers; random noise; random walk processes; voltage offsets; 1f noise; Aging; Choppers; Circuit noise; FETs; Lattices; Operational amplifiers; Stability; Temperature; Voltage;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
