DocumentCode
1442267
Title
Long-term behavior of operational amplifiers
Author
Rubiola, Enrico ; Francese, Claudio ; De Marchi, Andrea
Author_Institution
ESSTIN, Vandoeuvre Les Nancy, France
Volume
50
Issue
1
fYear
2001
fDate
2/1/2001 12:00:00 AM
Firstpage
89
Lastpage
94
Abstract
The voltage and current offsets of two typical precision operational amplifiers (OPAs) with BJT and FET input, respectively, were continuously measured for two years. The paper presents the experiment, explains the method of data analysis, and discusses the results. The long-term stability turns out to be limited mainly by random walk processes
Keywords
CMOS analogue integrated circuits; bipolar analogue integrated circuits; flicker noise; integrated circuit noise; operational amplifiers; thermal noise; BJT amplifiers; FET amplifiers; ageing; current offsets; flicker parameters; long-term behavior; long-term stability; operational amplifiers; precision amplifiers; random noise; random walk processes; voltage offsets; 1f noise; Aging; Choppers; Circuit noise; FETs; Lattices; Operational amplifiers; Stability; Temperature; Voltage;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/19.903883
Filename
903883
Link To Document