Title :
BIST to Detect and Characterize Transient and Parametric Failures
Author :
Sanyal, Alodeep ; Alam, Syed M. ; Kundu, Sandip
Abstract :
The continual scaling of device dimensions is increasing both parametric failures, stemming from circuit marginality issues, and soft errors, from the impact of high-energy particles on semiconductor surfaces. Effectively detecting and estimating such intermittent failures is crucial for reliability, availability, and serviceability (RAS) characterization of chips. This BIST-based approach distinguishes intermittent failures from permanent failures and reduces test time and cost.
Keywords :
built-in self test; failure analysis; integrated circuit testing; reliability; built-in self test; circuit marginality; parametric failure detection; reliability availability serviceability; soft errors; transient failure detection; Automatic testing; Built-in self-test; Circuit testing; Costs; Delay effects; Error analysis; Hardware; Integrated circuit measurements; Semiconductor device measurement; Time measurement; BIST; design and test; linear feedback shift register; multiple input signature register; parametric failure; soft error;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.2010.30
