DocumentCode :
1442525
Title :
High temperature superconducting fault current limiter development
Author :
Leung, E.M. ; Rodriguez, I. ; Albert, G.W. ; Burley, B. ; Dew, M. ; Gurrola, P. ; Madura, D. ; Miyata, G. ; Muehleman, K. ; Nguyen, L. ; Pidcoe, S. ; Ahmed, S. ; Dishaw, G. ; Nieto, C. ; Kersenbaum, I. ; Gamble, B. ; Russo, C. ; Boenig, H. ; Peterson, D.
Author_Institution :
Lockheed Martin Corp., Rancho Bernardo, CA, USA
Volume :
7
Issue :
2
fYear :
1997
fDate :
6/1/1997 12:00:00 AM
Firstpage :
985
Lastpage :
988
Abstract :
A near term high-temperature superconductor (HTS) application is the fault current limiter (FCL). This paper describes the development and testing of a 2.4 kV, 2.2 kA(RMS) fault current, 150 A(RMS) continuous current, HTS FCL that uses a Bi-2223 Ag-based conductor. The Lockheed Martin team, which included Southern California Edison (SCE), American superconductor Corporation (ASC) and Los Alamos National Laboratory (LANL), completed in October 1995 a two year Phase I program. This unit has undergone a six-week extensive testing at SCE´s Center Substation in Norwalk, California. The unit´s capability and test results are presented. Plans for the construction of higher rating units including a phase II program are outlined. Descriptions of the underlying principle of a FCL and how it can benefit the power utility industry are also presented.
Keywords :
bismuth compounds; calcium compounds; copper compounds; current limiters; high-temperature superconductors; lead compounds; overcurrent protection; power system protection; strontium compounds; superconducting devices; 150 A; 2.2 kA; 2.4 kV; Bi-2223; BiPb/sub 2/Sr/sub 2/Ca/sub 2/Cu/sub 3/O; HTSC fault current limiter development; development; power systems; power utility industry; protection applications; testing; Circuit faults; Costs; Fault current limiters; Fault currents; High temperature superconductors; Inductors; Prototypes; Superconducting transmission lines; Surges; Switches;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/77.614670
Filename :
614670
Link To Document :
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